Speakers
Description
Jakub Jała MSc Eng., Daniel Wójcik MSc, Joanna Lis-Kłoda MSc Eng.
The lecture introduces advanced sample preparation techniques for electron microscopy, focusing on methods essential for obtaining high-quality analytical results. It covers preparation procedures for both scanning (SEM) and transmission electron microscopy (TEM), discussing key aspects such as sample conductivity, holder selection, and handling of unconventional or biological materials. The fundamentals of the Focused Ion Beam–Scanning Electron Microscopy (FIB-SEM) technique are also presented, including its instrumentation, ion beam operation principles, and applications in cross-sectioning, lamella preparation, and 3D tomography, along with strategies to minimize artifacts. The final part of the lecture addresses ultramicrotomy—its theoretical basis, equipment design, and procedures for producing ultrathin sections of various materials. Applications in TEM, AFM, and surface analysis are discussed, highlighting the use of ultramicrotomy in studying nanomaterials, polymers, composites, and biological tissues, as well as modern trends such as cryo-sectioning, automation, and integration with advanced microscopy techniques.